Hesper Technologies Testers


Model 8710Model 8710

Microprocessor controlled automatic test system for performing parametric measurements on discrete semiconductor devices.

Devices & Parameters:

NPN, PNP transistors - BV & I (ECO, CEO, CER, CEX, CES, CBO, EBO), VBEF, VBESAT, VCESAT, HFE, 1+hfe,
                                      VBEON, EB2O, EEFF, HFE2, VBCF, REV HFE, EXP, IBEF, HFEB2, VB2ESAT, VCEB2SAT,
                                      VB2EON, EEFFB2, REVHFEB2
FET - BV & I (GDS, GSS, DSO, DSR, DSX, DSS, GDO, GSO), IDSON, VDSON, VT, VP, IDSOFF, VDSOFF, gfs
RECTIFIER, DIODE - BV, IR, VF

Voltage & Current Capability:

2000 Volts, 30 Amps

Features:

Modes of operation: Direct Readout, Go No-Go, Data Log
Stores up to 200 test programs.
Thumbwheel switch programming.
User selectable test times.
Built in self check routines.
IEEE-488 capable for test programming, storage, etc., using Hesper Technologies Host Operating System Software.
Special high current relay design for fast testing during wafer probing.
Can control up to 3 satellite test stations.
Auxiliary equipment connector for use with automatic handling equipment.


Model 8712Model 8712

Microprocessor controlled automatic test system for performing parametric measurements on discrete semiconductor devices.

Devices & Parameters:

NPN, PNP transistors - BV & I (ECO, CEO, CER, CEX, CES, CBO, EBO)
RECTIFIER, DIODE - BV, IR

Voltage & Current Capability:

2000 Volts, 1 Amp

Features:

Modes of operation: Direct Readout, Go No-Go, Data Log
Stores up to 200 test programs.
Thumbwheel switch programming.
User selectable test times.
Built in self check routines.
IEEE-488 capable for test programming, storage, etc., using Hesper Technologies Host Operating System Software.
Auxiliary equipment connector for use with automatic handling equipment.


Model 8713Model 8713

Microprocessor controlled automatic test system for classifying MOV's ( metal oxide varistors ).

Devices & Parameters:

MOV - VPK1 (peak voltage), VPK2 (peak voltage), VNOM (breakdown voltage), DV (breakdown sharpness),
             VR (reverse voltage)

Voltage & Current Capability:

1000 Volts in 2 ranges
10 Amps in 7 ranges

Features:

Will perform tests in normal polarity, reverse polarity, or both.
Modes of operation: Direct Readout, Classify (up to 10 Types), Data Log
Stores up to 10 test programs.
Thumbwheel switch programming.
IEEE-488 capable for test programming, storage, etc., using Hesper Technologies Host Operating System Software.
Can control up to 3 satellite test stations.
Auxiliary equipment connector for use with automatic handling equipment.


       Model 8714

Same as Model 8713 except 2000 V, 10 A capability


Model 8715Model 8715

Same as Model 8713 except 2000 V, 40 A (in 8 ranges) capability.


Model 8801Model 8801

Microprocessor controlled automatic test system for measuring the leakage current of two leaded devices.

Devices & Parameters:

Any 2 leaded device - IR

Voltage & Current Capability:

1-1000 Volts, 10 uA (in 3 ranges)

Features:

May be used as stand alone instrument or as expansion test module with any Hesper or Mastech tester.
Modes of operation: Direct Readout
Thumbwheel switch programming.
Selectable test (soak) time, 1 mS to 10 S.
Selectable automatic ranging.
Normal or reverse polarity, or both.


Model 9001Model 9001

Microprocessor controlled automatic test system for measuring the resistance of 2 leaded devices such as polyswitches
or resistors.

Devices & Parameters:

2 leaded devices - Resistance

Current & Resistance Capability:

5 - 500 mA test current
0.004 Ohms - 6 Ohms

Features:

Built in 10 device scanner for strip testing.
Automatic temperature normalization of test result to 20 degrees C.
Selectable temperature polling frequency.
2 to 35 mV measurement compliance.
Automatic calibration.
Test time under 15 mS.
Modes of operation: Direct Readout, Go No-Go (upper and lower limits)
Programs via RS232 from host computer or smart terminal.
Auxiliary equipment connector for use with automatic handling equipment.


Model 9002

Microprocessor controlled automatic test system for performing parametric measurements on discrete semiconductor devices.

Devices & Parameters:

DIODE, RECTIFIER - IR, VR, VF
ZENER - IR, VZ, VF, VFR, ZZ
CURRENT REGULATOR - IP, VL
STABISTOR - IR, VF
NPN, PNP transistor - I( ), VBR( ), hFE, VBE(SAT), VCE(SAT), VBE(ON), 1+hfe, VCEO(SUS)
FET - I( ), VBR( ), IDS(ON), VDS(ON), rDS(ON), VT, VP, IDS(OFF), VDS(OFF), VGS(ON), gfs
SCR - I( ), VBR( ), IGT, VGT, VTM, IH, IL
TRIAC - IDRM(+,-), VDRM(+,-), IH(++,--), VTM(++,--), IGT(++,--,+-,-+), VGT(++,--,+-,-+), IL(++,--)
SBS - IGF, IH, IB, VF
OPTOCOUPLER (TRANSISTOR OUTPUT) - All diode tests on LED, all transistor tests on output transistor,
    CTRIC, CTRVCE, CTRIF, CTRVF
TRIAC OPTOCOUPLER - All diode tests on LED, IDRM, VTM, IFT, IH, VIH
SCHMITT OPTOCOUPLER - All diode tests on LED, ICC(OFF), IOH, ICC(ON), VOL, IF(ON), IF(OFF),
    IF(OFF)/IF(ON)
IGBT - ICES, BVCES, VGE(TH), IGES, VCE(ON), VGEP, VCE(SAT)
VOLTAGE REGULATOR - VO, REG(LINE), REG(LOAD), IB, VI-VO

Voltage & Current Capability:

1000 Volts, 10 Amps

Features:

Modes of operation: Direct Readout, Go No-Go, Data Log
Stores up to 1000 test programs.
Battery backup for program retention.
Automatic or manual diode polarization.
Selectable auto ranging.
Expansion port for insertion of external measurements.
Software counters for tests failed, total tested, etc.
User selectable test times.
Built in self check routines.
IEEE-488 connector for test programming, storage, etc., using Hesper Technologies Host Operating System Software.
Can control up to 3 satellite test stations.
Auxiliary equipment connector for use with automatic handling equipment.
Optional voltage to 2000 Volts.
Optional current to 500 Amps.


Model 9003

Microprocessor controlled automatic test system for performing parametric measurements on discrete semiconductor devices.

Devices & Parameters:

DIODE, RECTIFIER - IR, VR, VF

Voltage & Current Capability:

1000 Volts, 10 Amps

Features:

Modes of operation: Direct Readout, Go No-Go, Data Log
Stores up to 1000 test programs.
Battery backup for program retention.
Automatic or manual diode polarization.
Selectable auto ranging.
Expansion port for insertion of external measurements.
Software counters for tests failed, total tested, etc.
User selectable test times.
Built in self check routines.
IEEE-488 connector for test programming, storage, etc., using Hesper Technologies Host Operating System Software.
Can control up to 3 satellite test stations.
Auxiliary equipment connector for use with automatic handling equipment.
Optional voltage to 2000 Volts.
Optional current to 500 Amps.
 


Model 9512

Microprocessor controlled automatic test system for High Current VPK measurements on MOV's ( metal oxide varistors ) - 100 V, 40 A capability, 1% accuracy.
 


Model 9602Model 9602

Microprocessor controlled automatic test instrument for measuring the voltage developed across a two leaded device with a given current applied. (Source - Measure unit)

Devices & Parameters:

2 leaded devices - Voltage

Voltage & Current Capability:

150 Volts (in 2 ranges)
100 mA to 10 Amps

Features:

Modes of operation: Direct Readout, Go No-Go
Stores up to 10 test programs.
Programmed and controlled by computer or terminal via RS-232.
Auxiliary equipment connector for use with automatic handling equipment.
Normal or reverse polarity.


Contact us at:

Hesper Technologies, Inc.

1608 Westmoreland Ave.
Syracuse, NY 13210

Phone: 315-446-6987
Fax: 315-446-6987
E-mail:hestech@earthlink.net
 
 

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Last Modified: 17 March 2008
URL: http://home.earthlink.net/~hestech/testers.html

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